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Monday, August 30, 2021 | History

4 edition of Automated testing of electro-optical systems, 7-8 April 1988, Orlando, Florida found in the catalog.

Automated testing of electro-optical systems, 7-8 April 1988, Orlando, Florida

  • 228 Want to read
  • 16 Currently reading

Published by SPIE in Bellingham, Wash., USA .
Written in English

    Subjects:
  • Electrooptical devices -- Testing -- Congresses.,
  • Automatic test equipment -- Congresses.

  • Edition Notes

    Includes bibliographical references.

    StatementJohn Nestler, Philip I. Richardson, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.].
    GenreCongresses.
    SeriesProceedings of SPIE--the International Society for Optical Engineering ;, v. 941
    ContributionsNestler, John., Richardson, Philip I., Society of Photo-optical Instrumentation Engineers.
    Classifications
    LC ClassificationsTA1750 .A87 1988
    The Physical Object
    Paginationvi, 106 p. :
    Number of Pages106
    ID Numbers
    Open LibraryOL2064694M
    ISBN 100892529768
    LC Control Number88061021

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Automated testing of electro-optical systems, AprilOrlando, Florida John Nestler, Philip I. Richardson, chairseditors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics LaboratoryNew Mexico State University.

Automated testing of electro-optical systems, AprilOrlando, Florida by, AugustSociety of Photo Optical edition, Paperback in English. Boston University Libraries. Services. Navigate; Linked Data; Dashboard; Tools Extras; Stats; Share.

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Automated testing of electro-optical systems, AprilOrlando, Florida Orlando Nestler, Philip I. Richardson, chairseditors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics LaboratoryNew Mexico State University [et al.

] Proceedings SPIE -- the International Society for Optical Engineering, v. SPIE, c : Automated testing of electro-optical systems, AprilOrlando, Florida: : Nestler, John Richardson, Philip I.

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